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An Adaptive Texture and Shape Based Defect Classification

Iivarinen, J.; Visa, A.
-1998

Shape-Based Co-occurrence Matrices for Defect Classification

Rautkorpi, R.; Iivarinen, J.
-2005

Defect Image Classification and Retrieval with MPEG-7 Descriptors

Vertaisarvioitu
Pakkanen, Jussi; Ilvesmäki, A.; Iivarinen, J.
-2003

Defect Image Classification with MPEG-7 Descriptors

Vertaisarvioitu
Ilvesmäki, Antti; Iivarinen, J.
-2002

Automated Visual Defect Classification for Flat Steel Surface: A Survey

Vertaisarvioitu
Avoin saatavuus
DOI
10.1109/TIM.2020.3030167
Luo, Qiwu; Fang, Xiaoxin; Su, Jiaojiao; Zhou, Jian; Zhou, Bingxing; Yang, Chunhua; Liu, Li; Gui, Wei...
IEEE transactions on instrumentation and measurement2020

Insulation defect localization through partial discharge measurements and numerical classification

Vertaisarvioitu
Pöyhönen, Sanna; Conti, Marco; Cavallini, Andrea; Montanari, Gian C.; Filippetti, Fiorenzo
IEEE2004

A Novel Self-Organizing Neural Network for Defect Image Classification

Pakkanen, J.; Iivarinen, J.
-2004

Determination of defect content and defect profile in semiconductor heterostructures

Vertaisarvioitu
DOI
10.1088/1742-6596/265/1/012004
Zubiaga, A.; Garcia, J.A.; Plazaola, F.; Zuñiga-Perez, J.; Muñoz-Sanjose, V.
Journal of Physics: Conference Series2011

Evaluation of Features for Defect Image Retrieval

Vertaisarvioitu
Iivarinen, Jukka; Ilvesmäki, A.; Pakkanen, J.
-2003

Point defect balance in epitaxial GaSb

Vertaisarvioitu
Avoin saatavuus
DOI
10.1063/1.4894473
Segercrantz, N.; Slotte, J.; Makkonen, I.; Kujala, J.; Tuomisto, F.; Song, Y.; Wang, Shumin
Applied Physics Letters2014

An Adaptive Texture and Shape Based Defect Classification

1998

Shape-Based Co-occurrence Matrices for Defect Classification

2005

Defect Image Classification and Retrieval with MPEG-7 Descriptors

Vertaisarvioitu
2003

Defect Image Classification with MPEG-7 Descriptors

Vertaisarvioitu
2002

Automated Visual Defect Classification for Flat Steel Surface: A Survey

Vertaisarvioitu
Avoin saatavuus
DOI
10.1109/TIM.2020.3030167
2020

Insulation defect localization through partial discharge measurements and numerical classification

Vertaisarvioitu
2004

A Novel Self-Organizing Neural Network for Defect Image Classification

2004

Determination of defect content and defect profile in semiconductor heterostructures

Vertaisarvioitu
DOI
10.1088/1742-6596/265/1/012004
2011

Evaluation of Features for Defect Image Retrieval

Vertaisarvioitu
2003

Point defect balance in epitaxial GaSb

Vertaisarvioitu
Avoin saatavuus
DOI
10.1063/1.4894473
2014